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Mr. Sano joined the Company as Vice President Aehr Test Systems Japan K.K. the Company’s subsidiary in Japan in June 1998 and was elected President Aehr Test Systems Japan K.K. in January 2001. From 1991 to 1998 he served as Manager of the Development Engineering Department at Tokyo Electron Yamanashi Limited a leading worldwide semiconductor equipment manufacturer. Mr. Sano received a B.S.E.E. from Sagami Institute of Technology in Kanagawa Japan. | 