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Benoit Nadeau-Dostie, Ph.D., has served as our Chief Scientist since 1994. He was the primary architect of the design-for-test/embedded test program for Northern Telecom (now Nortel Networks) and Bell-Northern Research that resulted in several key patents related to built-in self-test. He has been published in numerous journals, magazines, and conference proceedings, specifically in the areas of memory, logic and printed circuit board embedded test. Dr. Nadeau-Dostie has been co-inventor of more than 30 patents, issued or pending, and the editor of the book Design for At-Speed Test, Diagnosis and Measurement. He was elected a senior member of the IEEE based on his contributions in embedded test and design-for-test. Dr. Nadeau-Dostie is a member of the International Test Conference program committee and of the IEEE 1149.1 Standard Working Group. | 