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Mr. Crouch is responsible for research and the generation of development plans for new DFT methodologies, as well as providing technical consultancy to semiconductor companies who are pursuing DFT test methodologies. Prior to joining Inovys, Al was a Principal Member of Technical Staff and DFT Manager for the Embedded Platform Solutions Organization at Motorola. Al's 20 years of experience in semiconductor design and test has also included DEC and Texas Instruments. During his career, Al has advocated improvements in test strategies in which he holds 13 patents. He is the widely read author of Design-For-Test For Digital IC's and Embedded Core Systems, in addition to many articles published in EE Times, and IEEE Design & Test. Al has frequently contributed to the International Test Conference as Presenter, Panel Member, Session Chair, and Paper Reviewer of DFT methodologies. Al has been a lecturer at University of New Mexico and at University of Texas as well as the Tutorial Session at the Design Automation Conference. | 